Imaging and Modeling in Electron Microscopy - Recent Advances

Arriving Sunday, May 18 and departing Friday May 23, 2014

Confirmed Participants

Name Affiliation
Anden, Joakim Flatiron Institute
Arslan, Ilke Pacific Northwest National Laboratory
Bajaj, Chandrajit University of Texas at Austin
Berkels, Benjamin RWTH Aachen University
Bhamre, Tejal Princeton University
Binev, Peter University of South Carolina
Blom, Douglas University of South Carolina
Browning, Nigel Pacific Northwest National Laboratory
Chen, Yutong Princeton University
Dahmen, Wolfgang University of South Carolina
Davenport, Mark Georgia Institute of Technology
Dwyer, Christian Forschungszentrum Juelich
Findlay, Scott Monash University
Haigh, Sarah University of Manchester
Han, Bin University of Alberta
Huang, Chen University of Oxford
Kelly, Kevin Rice University
Krahmer, Felix University of Göttingen
Kutyniok, Gitta Technische Universität Berlin
Lamby, Philipp Texas A&M University
Lobato Hoyos, Ivan Pedro University of Antwerp
Mayer, Joachim RWTH-Aachen
Mevenkamp, Niklas RWTH-Aachen
Reed, Bryan Integrated Dynamic Electron Solutions, Inc.
Sadowski, Jerzy Brookhaven National Laboratory
Saghi, Zineb CEA Grenoble
Sanders, Toby University of South Carolina
Scherzer, Otmar University of Vienna
Shen, Zuowei National University of Singapore
Shen, Yi University of Alberta
Shkolnisky, Yoel Tel-Aviv University
Singer, Amit Princeton University
Stevens, Andrew Pacific NW Natl Lab / Duke Univ
Tantardini, Francesca University of South Carolina
Van Dyck, Dirk University of Antwerp
Vogt, Thomas University of South Carolina - NanoCenter
Voyles, Paul University of Wisconsin - Madison
Ward, Rachel University of Texas at Austin
Yankovich, Andrew University of Wisconsin-Madison
Zhang, Teng Princeton University