Imaging and Modeling in Electron Microscopy - Recent Advances (14w5048)
Peter Binev (University of South Carolina)
Nigel Browning (Pacific Northwest National Lab)
Wolfgang Dahmen (Rheinisch-Westfälische Technische Hochschule - Aachen)
Ronald DeVore (Texas A & M University)
Thomas Vogt (University of South Carolina - NanoCenter)
Paul Voyles (University of Wisconsin - Madison )
The aim of the workshop is to connect mathematicians together with specialists in imaging, material science, and electron microscopy to advance modeling, simulation and analysis by incorporating state-of-the-art mathematical and computational tools and methods in electron microscopy. It will be instrumental to build foundations for interdisciplinary research by engaging all these subject areas. This workshop will provide the opportunity to present and exchange ideas, share data, and introduce new tools and develop new imaging and sensing paradigms needed in a variety of fields.
The participants of the workshop will share their latest results in the variety of mathematical areas including Learning Theory, Variational Methods, Multiscale Approximation, and Compressed Sensing, as well as their application in processing data obtained from a variety of probes exploring materials at the atomic level with application in materials and life sciences, such as scanning transmission electron microscopy, cryo-electron microscopy, and electron tomography. An important focus will be the development of a roadmap to couple instrumentation with advanced mathematical tools and models and open up new areas to imaging.
The list of potential participants includes established specialists in their respective domains that have been involved in cross-disciplinary collaborations applying advanced mathematical methods in processing electron microscopy data. The workshop will include young researchers in the early stages of their careers and graduate students.
The workshop will be critical in advancing several collaborations and building understanding of the problems from both the theoretical and the application sides. It will be held at the time when the significant advances in electron microscopy can come only with deep mathematical understanding of the phenomena and application of new data processing techniques. At the same time the interactions will present the mathematicians with ideas for new theoretical developments with practical relevance.